題名: Semiautomatic Test Case Generation Based on Sequence Diagrams
作者: Lei, Yao-Cheng
Lin, Nai-Wei
關鍵字: UML
sequence diagrams
test case generation
期刊名/會議名稱: 2008 ICS會議
摘要: This article describes a semiautomatic test case generation tool for Java classes based on UML sequence diagrams. Sequence diagrams are used to specify dynamic behaviors among objects. This tool is developed to facilitate the semiautomatic generation of test cases in integration testing level. This tool automatically generates a suite of test paths from sequence diagrams. Given an input data and the corresponding expected output data for each test path from the user, this tool automatically generates a Java method that executes the test path. This tool generates Java test classes for the JUnit framework.
日期: 2009-02-10T06:46:59Z
分類:2008年 ICS 國際計算機會議

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